Veex TX300S Integrated Network Tester (USA)

General Specifications

Dimensions: 290 x 140 x 66 mm (W x H x D)

Weight: Less than 3 kg

Battery: Built-in lithium battery 5200  10.8VDC

AC Adapter Input: 100-240VAC, 50-60Hz  Output 15VDC, 5.33A

Operating Temperature: 0℃ to 45℃ Storage Temperature: -20℃ to 70℃

Humidity: 5% to 95% non-condensing

Display: 7” true color touchscreen

Ruggedness: 1 m drop on concrete without damage

Interfaces: USB 2.0, RJ45, 10/100-T Ethernet, Bluetooth 2.0 (optional)

Data Card/GPS (optional)

Language: Multi-language support

System Memory: 1G

RAM: 4G SD card

TX300S Network Multi-Test Platform Highlights

• Intuitive graphical user interface

• High-resolution color touchscreen operable in complex environments

• Optimized for field engineers or technicians installing and maintaining OTN and SDH transmission networks, as well as next-generation mobile backhaul network testing

• Flexible software platform allows running multiple test applications simultaneously

• Convenient background application and workload management via 10/100BASE-T, WiFi, and Bluetooth connections

• Atomic clock for high-stability applications, ensuring 1ppb accuracy (TX300S only)

• Optional GPS receiver for one-way delay testing and as a reference clock source

• Connect external GPS device via RS232C interface to receive ToD and 1PPS synchronization clock

  CPRI Testing

• Rates: 614.4 Mbps, 1.2288 Gbps, 2.4576 Gbps, 3.072 Gbps, 4.9152Gbps, 6.144Gbps, 9.8304 Gbps, 10.137Gbps, 12.1651Gbps

• Supports BER testing with PRBS patterns, and LOS, LOF, SDI, RAI alarm generation

• Delay testing, SDT testing, supports Master and Slave emulation

  OTN/SDH/PDH (Supports OTU4 Rate)

• Supports optical port SDH/SONET testing at rates STM-0/1/4/16/64 and OC1/3/12/48/192; also supports STM-0/1E (STS-1/3) electrical ports

• Supports OTN testing at rates OUT-0/1/2; OTU1e/OTU2e (optional)

• Supports PDH testing: E1, E2, E3; DS1, DS3 , E4 (optional)

  Dual PDH and DSn interfaces

• Supports non-intrusive pulse template analysis for E1, E3, DS1, and DS3

• Optical power, electrical interface signal level, frequency testing

• Channel trace and pointer generation and analysis 

• APS testing 

• Supports loop delay testing for all interfaces and payload mappings 

• Overhead monitoring and byte decoding 

• Cascaded monitoring function

• Jitter and wander analysis (E1, E3, DS1, DS3 and STM-1o, OC-3)

  SyncE/IEEE 1588v2

• Complete solution for synchronous packet networks

• Supports IEEE 1588v2/PTP and SyncE/ITU-T G.8261 standards

• Master and Slave clock emulation 

• IEEE 1588v2/PTP protocol monitoring and decoding

• IEEE 1588v2/PTP PDV analysis

• Can recover clock from SyncE or PTP and output to E1 or DS1 interface

• Supports ESMC SSM generation, monitoring, and decoding

  Ethernet/Fibre Channel Testing (Supports 100G)

• Dual 10GE LAN/WAN SFP ports (for TX300S), dual 100Base-FX/ 1000Base-X SFP ports, dual 10/100/1000Base-T RJ45 ports

• Supports 1G/2G/4G/8G/10G/16G Fibre Channel testing for SAN networks

• V-SAM test suite compliant with ITU-T Y.1564 standard

• IPv4 and IPv6 traffic generation

• Throughput, delay, frame loss, and back-to-back testing per RFC2544

• Supports IEEE 802.3ah, ITU-T Y.1731, IEEE 802.1ag, and MPLS-OAM, supports Q-in-Q (VLAN stacking) and multiple MPLS labels

  Supports 100G CFP4 interface and QSFP+ 40G interface

  PDH/DSn Applications

  Developed in the 1960s and 1970s, PDH and T-carrier (DSN) multiplexing and transmission systems form the foundation of new-generation digital communication network technologies. Although these networks have evolved to include long-distance, high-capacity aggregation, OTN, SDH, and SONET ring networks, PDH and DSn network segments often remain due to access, service delivery, and economic factors. Therefore, PDH and T-carrier network testing will continue for many years.

  The TX300S provides PDH testing capabilities at rates from 140 Mbps (E4), 34 Mbps (E3), 8 Mbps (E2), 2 Mbps, to N/M×64 kbps, as well as 45 Mbps (DS3), 1.5 Mbps (DS1), to N/M×56 kbps. Other test functions include simultaneous display of multiple G.821, G.826, M.2100 results, pulse template analysis, and loop delay testing. Test rates also include mapping and demapping of E1, E3, and E4 payloads into virtual containers, as well as overhead testing for TU-11, TU-12, TU-3, STS-1, and AU-4, suitable for testing hybrid PDH/SDH and DSN/SONET networks.

  PDH/DSn Performance