Chronometer Time Difference Tester QWA-3B

Clock Time Difference Tester, Second Difference Meter QWA-3B

　　The Clock Time Difference Tester, Second Difference Meter QWA-3B is suitable for precise measurement of clock circuits using 32.768KHz crystal oscillators, such as computer motherboards and electronic perpetual calendars. It features three measurement ranges: ppm (parts per million difference), s/d (daily error), and s/m (monthly error).

　　The Clock Time Difference Tester, Second Difference Meter QWA-3B adopts a non-contact method without the need for electrical connection to the circuit under test. It comes in a deluxe aluminum alloy casing with an extra-large sensor area for enhanced sensitivity. Equipped with a built-in fast processor and TCXO with an accuracy better than 0.5ppm, it provides intuitive 16-level signal strength indication. Upper and lower limit values can be set, with automatic alarm when exceeded. We solemnly promise that the performance of the QWA-3B motherboard clock tester produced by our company, including sensitivity and anti-interference capabilities, surpasses similar products from other companies on the market, and it offers more functions.

　　Features of the Clock Time Difference Tester, Second Difference Meter QWA-3B:

　　1. Aluminum alloy casing

　　2. Measurable frequency: 32.768KHz

　　3. Includes a crystal PPm value test port

　　4. Display method: 4-digit LED digital tube

　　5. Three measurement ranges: PPm, s/d, s/m

　　6. Equipped with one 1.0-meter high-sensitivity probe, suitable for testing larger circuit boards

　　7. High-precision temperature-compensated clock reference, adaptable to seasonal temperature changes, accuracy better than 0.4ppm
        8. Dimensions: 260×120×220mm