IGBT Module Static Parameter Tester
Contact Info
- Add:深圳市宝安区西乡街道智慧创新中心, Zip: 518102
- Contact: 陈先生
- Tel:13008867918
- Email:chensl@hustec.cn
Other Products
HUSTECHuake Zhiyuan
IGBT Module Static Parameter Test System
I: IGBT Module Static Parameter Test System Main Features
Huake Zhiyuan Electrical Parameter Tester can be used for testing IGBTs in various package forms, and can also measure the V-I characteristics of high-power diodes, IGBT modules, high-power IGBTs, high-power bipolar transistors, MOSFETs, and other devices. It tests various power devices up to 600A (expandable to 2000A) and 5000V, widely used in rail transportation, electric vehicles, wind power generation, inverters, and welding machine industries for IGBT incoming material selection and failure analysis. The equipment can also be used for online maintenance in industries such as inverters, wind power, rail transportation, and welding machines, without the need to remove components from the circuit board for separate testing. It enables online IGBT detection, with convenient and simple testing procedures. Parameters can be set directly in the test host for testing, or automatic testing can be performed via software-controlled host programming. Static parameter testing is completed through computer operation.
IGBT Module Static Parameter Test System Test Parameters:
ICES Collector-Emitter Leakage Current
IGESF Forward Gate Leakage Current
IGESR Reverse Gate Leakage Current
BVCES Collector-Emitter Breakdown Voltage
VGETH Gate-Emitter Threshold Voltage
VCESAT Collector-Emitter Saturation Voltage
ICON On-State Electrode Current
VGEON On-State Gate Voltage
VF Diode Forward Voltage Drop
The entire testing process is automated. The computer software includes a database management and query function, and can generate test curves for easy operation and use.
II: IGBT Module Static Parameter Test System Application Scope
A: IGBT discrete devices and modules,
B: High-power MOSFETs (Mosfet)
C: High-power diodes
D: Standard low-resistance resistors
E: Screening and online fault detection in industries such as rail transportation, wind power generation, new energy vehicles, inverters, and welding machines
III. IGBT Module Static Parameter Test System Features:
A: Measures various IGBTs and MOSFETs
B: Pulse current 1200A, voltage 5KV, wide testing range;
C: Pulse width 50uS~300uS
D: Vce measurement accuracy 2mV
E: Vce measurement range 10V
F: Computer graphical display interface
G: Intelligent protection for measured devices
H: Host computer with database function
I: Internal diode voltage drop of MOSFET/IGBT
J: Tests all static parameters of IGBT in one go
Generates test curves (IV curves visually display IGBT characteristics, enabling failure analysis and fault localization)
L: Allows comparison of different curves to observe the curve status of products from the same batch or compare curves of the same specification parameters from different manufacturers;
No. | Test Item | Description | Measurement Range | Resolution | Accuracy |
1 | VF | Diode Forward Voltage Drop | 0~20V | 1mV | ±1%,±1mV |
2 | IF | Diode Forward Current | 0~1200A | ≤200A, 0.1A | ≤200A, ±1%±0.1A |
3 | >200A, 1A | >200A, ±1% | |||
4 | Vces | Collector-Emitter Voltage | 0~5000V | 1V | ±1%,±1V |
5 | Ic | On-State Collector Current | 0~1200A | ≤200A, 0.1A | ≤200A, ±1%±0.1A |
6 | >200A, 1A | >200A, ±1% | |||
7 | Ices | Collector-Emitter Leakage Current | 0~50mA | 1nA | ±1%,±10μA |
8 | Vgeth | Gate-Emitter Threshold Voltage | 0~20V | 1mV | ±1%,±1mV |
9 | Vcesat | Collector-Emitter Saturation Voltage | 0~20V | 1mV | ±1%,±1mV |
10 | Igesf | Forward Gate Leakage Current | 0~10uA | 1nA | ±2%,±1nA |
11 | Igesr | Reverse Gate Leakage Current | |||
12 | Vges | Gate-Emitter Voltage | 0~40V | 1mV | ±1%,±1mV |
Huake Zhiyuan's Static Parameter Test System is an intelligent test system developed specifically for various static parameters. It features a high degree of automation (automatically operates according to the program set by the operator), records test results via computer, stores test results in text format, flexible testing methods (can test discrete devices as well as single-unit and multi-unit modules), safety and stability (real-time monitoring of equipment status with hardware interlocking), safety protection functions, and fast and convenient testing speed.
| Industry Category | Measurement-Analysis-Instruments |
|---|---|
| Product Category | |
| Brand: | 华科智源 |
| Spec: | HUSTEC-1600A |
| Stock: | |
| Origin: | China / Guangdong / Shenshi |