Transistor Curve Tracer

Product Introduction  

The product features a desktop structure, consisting of two main parts: the test host and the programmable computer. It can be equipped with various fixtures and adapters, and optionally connected to sorting machines and robotic arms via Prober interface or Handler interface (16Bin) to establish a workstation for rapid batch testing. Through software settings, it can automatically classify and store devices based on their parameter levels. It is well-suited for various scenarios such as "Incoming Quality Control," "Failure Analysis," "Selection and Matching," and "Mass Production Testing." 

The product demonstrates excellent reliability, repeatability of test data, and testing efficiency. The innovative "point-control fixture" allows operators to perform tests with a single touch on the fixture, making operations simpler and more efficient. Test data can be saved as Excel files.

Application Scenarios

Ø Testing and Analysis (Initial testing during the R&D and design phase of power devices) 

Ø Failure Analysis (Testing and analyzing failed devices to identify failure mechanisms, thereby facilitating improvements in the overall design and usage process of electronic systems) 

Ø Selection and Matching (Conducting comprehensive testing before devices are soldered onto circuit boards, and classifying and pairing devices with consistent test data) 

Ø Incoming Quality Control (Sampling or full inspection of incoming devices by quality departments (IQC) in research institutes and electronics factories to ensure device yield rates) 

Ø Mass Production Testing (Can be connected to robotic arms, barcode scanners, sorting machines, and other auxiliary equipment to achieve large-scale, automated testing)