Gate Resistance/Capacitance Tester

Measurable parameters: Ciss/Coss/Crss/Rg MOSFET junction capacitance testing

Testable devices: IGBT, diodes, GaN, SiC MOSFET, etc.

Test frequency: 1MHz

Test voltage range: Vds 0~1200V, Vgs ±25V

Signal voltage range: 1mV~1000mV

Rg range: ≤300Ω

Test accuracy: 0.01pf

Features of Huake Zhiyuan Gate Resistance/Gate Capacitance Tester:

1. Fast testing speed.

2. Supports point testing and curve scanning.

3. High test accuracy with stable and precise results.

4. Data and waveforms can be saved at any time, and images for datasheets or CSV point files can be directly generated.