Surge Current Tester

Huake Zhiyuan - Diode Surge Current Tester, capable of testing the surge current capacity of diodes, MOSFETs, IGBTs, and SiC devices. It can output sinusoidal half-waves or square waves with base widths of 10ms, 8.3ms, 1ms, 10μs, etc. Surge current options include 800A, 1200A, 3000A, and custom configurations above 8000A, with a maximum current of up to 50kA.

Brand: Huake Zhiyuan
Name: Surge Current Tester
Model: HUSTEC-IFSM-1200A
Purpose: Surge current refers to the peak current generated at the moment the power line is connected or under abnormal circuit conditions, which is far greater than the steady-state current.

Product Details
Huake Zhiyuan - Diode surge current refers to the peak current or overload current generated at the moment the power line is connected or under abnormal circuit conditions, which is far greater than the steady-state current.

Semiconductor devices may sometimes need to withstand significant impact currents during operation. Depending on the application, the required surge current tolerance of the device varies. To test a device's ability to withstand surge currents, a large surge current can be generated and applied to the device under test, thereby determining whether it can endure the impact of high surge currents.



The testing method of the Huake Zhiyuan Surge Current Tester complies with the relevant standards in JB/T7626-2013. The surge current test bench is an important testing equipment for diodes and other related semiconductor devices. This equipment has the following features:

1. The test bench is a high-current, high-voltage testing system with stringent requirements for electrical performance.

2. The test control of the bench is fully automated, allowing tests to be conducted automatically according to the program set by the operator.

3. The test bench uses a computer to record test results and can convert the results into Excel files for further processing.

4. The testing system mainly consists of the following units:

a. Surge test unit

b. Blocking parameter test unit

c. Computer control system

II. Technical Conditions
2.1 Environmental Requirements:
1. Ambient temperature: 15–40°C

2. Relative humidity: Storage humidity not exceeding 80%

3. Atmospheric pressure: 86 kPa–106 kPa

4. Altitude: Below 1000 meters

5. Grid voltage: AC220V ±10%, no severe harmonics

6. Grid frequency: 50Hz ±1Hz

7. Power consumption: Less than 1.5 kW

8. Grid power factor: >0.9

2.2 Main Technical Specifications:
1. Surge current (ITSM/IFSM) test range: 30–1200A; optional configurations: 3000A, 8000A, 20kA, 50kA, etc.

2. Surge current (ITSM/IFSM) accuracy: Display resolution 1A, accuracy ±3%

Surge current (ITSM/IFSM) waveform: Approximate sinusoidal half-wave;

3. Surge current base width: 8.3ms and 10ms; optional configurations: 1ms, 10μs, etc.

4. Test frequency: Single; repetitive

5. Reverse voltage (VRRM) test range: 200–2000V;

6. Reverse voltage (VRRM) display resolution: 10V, accuracy ±3%;

7. Reverse voltage frequency: DC

8. All modules are manually connected and tested in single-device form.

9. Computer-controlled, with sampling and display capabilities;