LA-S Plant Image Analyzer Leaf Area Meter

LA-S Plant Image Analyzer System (Windows Tablet Touchscreen Leaf Area Meter)

I. Purpose

Used for plant leaf area analysis, etc.

II. Main Technical Specifications

1. Equipped with a Windows system tablet (≥10.1”/4GB RAM/64GB SSD/5MP camera/WIFI support), with a mobile power-assisted backlight panel (maximum measurement area: 350*245mm), capable of 4 hours of field backlight illumination, automatic calibration, and automatic image correction.

2. One-click operation for capturing and analyzing images, enabling batch automatic analysis of multiple leaves' area, perimeter, length-to-width ratio, length, and width; as well as parameters such as holes, shape coefficient, serration count, and petiole dimensions for individual leaves, with marked leaf edges for accuracy verification.

3. Capable of analyzing leaves as small as 1mm², with an analysis error <0.5%, analysis time <2 seconds per measurement, automatic independent labeling of each leaf with image saving functionality, and results exportable to Excel.

4. Automatically measures grain length, width, and projected area for non-overlapping seeds such as rice, wheat, and sunflower seeds.

III. Standard Configuration

1. LA-S Leaf Area Analyzer System software USB drive and software lock (1 set)

2. Windows-based tablet computer (1 unit)

3. Auxiliary backlight panel with mobile power supply (1 set)

IV. Additional Information

Optional 14MP high-depth-of-field color imaging device available.

Over 1,306 academic papers have been published using Wanshen analysis instruments.