NanoScan Slit-Scanning Laser Beam Profiler

Using the NanoScan Slit-Scanning Laser Beam Profiler

Scanning beam analysis is a classic beam measurement technique that samples a portion of the laser beam through a slit/pinhole, measures the intensity of the sampled portion with a single-point photodetector, and reconstructs the entire beam profile by scanning the position of the slit/pinhole.

Advantages of scanning beam profilers:

The sampling scale can reach the micrometer level, far smaller than CCD pixels, enabling high spatial resolution without magnification;

Utilizes a single-point detector, adaptable to a wide range of wavelengths from UV to mid-far infrared;

The single-point detector has a high dynamic range, allowing one probe to simultaneously analyze both weak and strong light.

Disadvantages of scanning beam profilers:

Multiple scans are required to reconstruct the beam profile, making it unsuitable for lasers with unstable output;

Not suitable for lasers with non-typical distributions, such as near-field spots with hot spots or fringes.

Scanning beam profilers and camera-based beam profilers are complementary rather than substitutive; in many applications, such as small spot measurement (focal point measurement) and high-resolution infrared beam analysis, scanning beam profilers have unique advantages.

Features and Functions

Capable of measuring continuous lasers and pulsed lasers with repetition rates greater than 1kHz. The sampling interval can be adjusted down to 5.7nm, enabling extremely precise measurement of very small spots.

Can display 2D/3D beam profiles

Adjustable scanning speed

16-bit digital signal acquisition, 35dB high dynamic range, 20Hz maximum refresh rate. Supports user secondary development for easy integration.

Probe can be equipped with a power meter option

Silicon, germanium, and pyroelectric detectors are available, covering a wide spectral range and power levels.

Can measure high-power or focal spot without attenuation. All NanoScan calibrations are traceable to NIST standards to ensure ultimate accuracy. Complies with international standards ISO/DIN11146 and ISO13694. (From 1989 to 1996, Photon Inc. led the ISO/DIN work and established the ISO/DIN11146 standard)

The NanoScan™ laser beam profiler provides an unprecedented beam measurement experience. The advantage of the slit-scanning laser beam profiler lies in its ability to achieve sub-micron accuracy and NIST-traceable precision when measuring beam position and size. Scanning head configurations include silicon, germanium, or pyroelectric versions, suitable for a wide range of wavelengths and laser power levels. NanoScan software is available in two versions: Standard and Professional, both including extensive ISO quantitative measurements, M² wizard, and laser power measurement capabilities.

NanoScan 2s Si/3.5/1.8: 7µm to ~2.3mm

The NanoScan slit-scanning beam profiler accurately captures and analyzes wavelengths from 190nm to 1100nm using its silicon detector. This profiler features slit sizes suitable for small beams, near-real-time data capture rates, optional power measurement functionality, and operates in continuous or kHz pulsed modes, making it ideal for comprehensive analysis of UV, VIS, and NIR lasers.

Beam size: 7µm to ~2.3mm

Power level range: ~10nW to ~10W

USB 2.0 interface

Includes NanoScan Standard or Professional software