Crystal Network Analyzer SN-100

Crystal Network Analyzer SN-100
I. Product Introduction
This product is a cost-effective crystal oscillator testing system that utilizes network analysis technology to achieve intelligent measurement, complying with the IEC-444 standard. The measurement frequency range is 10KHz-200KHz and 1MHz-100MHz, with a USB interface for data communication.
The Crystal Network Analyzer SN-100 series employs the π-network zero-phase method to measure series resonant frequency and uses the direct impedance method to test load resonant frequency and load capacitance. It offers high measurement accuracy and fast speed. It features measurement functions for parameters such as series resonant frequency Fr, load resonant frequency FL (ppm), series resonant resistance Rr, load resonant resistance RL, load capacitance CL, dynamic capacitance C1, dynamic inductance L1, quality factor Q, static capacitance C0, and frequency pulling Ts. The load capacitance can be programmed arbitrarily within the range of 1-200P to meet the testing needs of crystal oscillators with different load capacitances. The intelligent network analysis technology overcomes the shortcomings of poor testing accuracy and inability to test electrical parameters found in market crystal oscillator testing equipment that uses physical capacitance methods, eliminating the hassle of manual calibration and making crystal oscillator testing easier.
Compliance Standards:
SJ/Z 9154.1-87/ IEC 444-1(1989) "Measurement of Quartz Crystal Unit Parameters by Zero-Phase Technique in a π-Network—Part 1: Basic Method for the Measurement of Resonant Frequency and Resonant Resistance of Quartz Crystal Units by Zero-Phase Technique in a π-Network";
SJ/Z 9154.2-87/ IEC 444-2(1980) "Measurement of Quartz Crystal Unit Parameters by Zero-Phase Technique in a π-Network—Part 2: Phase Offset Method for the Measurement of Dynamic Capacitance of Quartz Crystal Units";
GB∕T22319.11-2018/IEC 60444-11:2010 "Measurement of Quartz Crystal Unit Parameters—Part 11: Standard Method for the Determination of Load Resonant Frequency and Effective Load Capacitance Using Automatic Network Analysis Techniques and Error Correction";
II. Main Technical Specifications
1. Center Frequency Range: 10KHz-200KHz, 1MHz-100MHz, arbitrarily settable
2. Sweep Range: ±1000ppm (default ±400ppm)
3. Load Capacitance: 1-200P, arbitrarily settable
4. Series Resonant Frequency Fr Measurement Range: ±1000ppm (default ±400ppm); Measurement Accuracy: ±5ppm
5. Series Resonant Resistance Rr: 1MHz-100MHz: 1Ω-1000Ω (2±10%*R Ω); 10KHz-200KHz: 10K-300K (2±10%*R KΩ)
6. Load Capacitance CL Measurement Range: 1-200PF
7. Timebase Error: ±1ppm
8. Load Resonant Frequency FL Measurement Accuracy: ±2ppm + timebase error + 0.5Pf * frequency pulling Ts
9. Accessories: Plug-in 100-ohm π-network test socket (standard), surface-mount 100-ohm π-network test socket (optional), plug-in watch crystal test socket (optional), surface-mount watch crystal test socket (optional), 2520/3225/5032/7050 surface-mount crystal oscillator adapter kit (optional), communication software.