Scanning Electron Microscopy in Materials Science

CEM3000 Material Science Scanning Electron Microscope by Zhongtu Instruments simplifies the complex SEM operation process with its user-friendly system. It demonstrates broad application value in industrial fields, featuring a standard high-performance secondary electron detector and multi-quadrant backscattered electron detector. Optional accessories such as an energy dispersive spectrometer and low vacuum system enable it to meet users' observation needs for various sample types, facilitating microscopic morphology and elemental analysis.

Unlike vertical electron microscopes, the Zhongtu CEM3000 Material Science Scanning Electron Microscope does not require significant space to accommodate the entire system, allowing it to fit even on a user's daily work desk, delivering real-time results at hand. Additionally, this series of desktop electron microscopes can perform effectively in confined spaces such as glove boxes, vehicle compartments, or submersibles. Even in working environments where conventional electron microscopes struggle, this desktop series demonstrates outstanding performance with its anti-vibration and anti-magnetic interference technology.

Product Features

1. High resolution to meet user observation requirements;

2. Fast pumping and venting to reduce waiting time;

3. High usability

Rapid imaging with one-click image capture;

4. Multiple imaging parameters

Meeting the adjustment needs of professional users;

5. High anti-vibration and anti-magnetic performance

Strong anti-interference capability;

6. Optional low vacuum mode, allowing users to set the vacuum level in the sample chamber as needed for observing different types of samples.

7. Large sample chamber

SEM3000A maintains a compact footprint while offering a chamber size comparable to vertical electron microscopes, accommodating larger samples;

8. Multiple detectors

Enabling simultaneous four-window scanning and imaging.

Application Scenarios

Materials Science: Microstructural analysis of nanomaterials (e.g., 60nm silver wires), high-entropy alloy powders, zinc oxide, etc.

New Energy: Defect detection in solar panels, coating performance evaluation.

Biomedical: Surface morphology observation of microfluidic chips, drug carrier research.

Industrial Quality Inspection: Solder ball welding quality, surface roughness detection of precision components.

Application Cases

The Material Science Scanning Electron Microscope features one-click sample loading, automatic navigation, and one-click imaging (auto-focus + auto-astigmatism correction + auto-brightness/contrast), enabling users to obtain high-definition images in just tens of seconds, significantly improving efficiency.

Model Selection

(Large Chamber Type): 70mm×70mm sample chamber, compatible with large-sized or multiple samples for batch analysis.

(Anti-Vibration Type): Designed for vibrating environments, faster pumping (low vacuum in only 40 seconds), and more stable imaging.

Please note: Due to market developments and product development needs, the content in this product documentation may be updated or modified at any time without prior notice. We appreciate your understanding regarding any inconvenience this may cause.

For inquiries or more detailed information, please feel free to contact Zhongtu Instruments for consultation.