BW-AH-5520

Semiconductor High-Precision Automatic Temperature Testing System

Product Name: Semiconductor High-Precision Automatic Temperature Testing System

Brand: Boway Electrotech

Name: Semiconductor High-Precision Automatic Temperature Testing System

Model: BW-AH-5520

Purpose: The BW-AH-5520 Semiconductor High-Precision Automatic Temperature Testing System adopts a special structural design to ensure high temperature stability and uniformity in the device under test (DUT) area. It utilizes dual high-precision RTD temperature sensors for precise temperature control and over-temperature protection, with multiple safety functions. It enables precise measurement, analysis, and screening of device performance across different temperatures.

Electrical Parameters

Configuration Specifications

Dimensions: 55W*95D*120H (cm)

Weight: <200kg

Power Supply: 380VAC/50Hz, 3-phase 5-wire, 35A/phase

Temperature Range: -55°C to 150°C (water-cooled or air-cooled); -65°C to 150°C (LN2 cooling); 200°C (optional)

Temperature Accuracy: +/-0.1°C (-55°C to 150°C); +/-0.8°C (150°C to 200°C); Temperature Resolution: 0.01°C

Test Tray: 4-inch/8-inch; Number of Stations: 49/98

Refrigeration Unit: Tecumseh (France)

Cooling Method: MR Mechanical Refrigeration (air-cooled/water-cooled) or LN2 Cooling

Lid Height: 10cm (4" standard); 15cm/20cm (6"/8" optional)

Remote Interface: RS-232/Ethernet

Display Control: 7-inch HD Capacitive Touch Screen

Cooling Water (RCW): 17-25°C softened water; Pressure: 0.3-1MPa; Flow Rate: 8 L/min

Product Features

1. Innovative轴对称 circular inner chamber design with circulating airflow control ensures high precision temperature stability and uniformity in the DUT area.

2. Suitable for precision online high/low-temperature testing of small electronic components, discrete devices, and integrated circuits in various packages such as DIP and SMD.

3. Precision stepper motor drive enables automated process testing (Leaded drive ring).

4. Customizable temperature test tray stations based on device package type and specifications.

5. The test chamber lid can be automatically raised and lowered electrically for easy placement and removal of temperature test trays, ensuring operational safety.

6. Each batch of devices is measured under the same configuration parameters, same station, and same temperature measurement points, enabling accurate analysis of temperature characteristics and batch comparison.

7. Equipped with RS-232 and Ethernet interfaces for remote automatic control.

Capable of performing high-precision automatic temperature testing on the following types of semiconductor devices:

(1) Quartz crystal resonators, oscillators

(2) Resistors, capacitors, inductors

(3) Diodes, transistors, MOSFETs, IGBTs, SCRs

(4) Optocouplers

(5) MEMS

(6) Surface Acoustic Wave (SAW) Devices

(7) Integrated Circuits

The BW-AH-5520 Semiconductor High-Precision Automatic Temperature Testing System supports air-cooled, water-cooled, and liquid nitrogen cooling methods. It is primarily used for precision online testing of performance parameters for various components and chips across the full temperature range.