BW-4022A

Semiconductor Discrete Device Static Test System

Brand: Boway Telecom

Name: Semiconductor Discrete Device Comprehensive Test System / Wide Bandgap Semiconductor Tester / Optocoupler Test

Model: BW-4022A

Purpose: Provides high-precision static parameter testing for Si/SiC/GaN material-based devices such as IPM/IGBT/MOS/DIODE/BJT/SCR, including DC parameters like conduction, shutdown, breakdown, leakage, gain, etc.

BW-4022A Product Introduction: The BW-4022A Transistor DC Parameter Tester is a new-generation semiconductor device test system. Through multiple upgrades and product iterations by our company, its test performance, accuracy, test range, and product stability have been significantly improved. It has become one of the essential testing devices for incoming inspection, R&D analysis, and product selection in industries such as semiconductor electronics, new energy, packaging and testing, home appliances, and scientific research and education.

The BW-4022A Transistor DC Parameter Tester features a large-scale 32-bit ARM MCU design, a PC-based Chinese operating interface, a high-voltage source of 2500V (optional 1.4KV–2KV), and a high-current source of 500A (optional 40A, 100A, 200A, 300A, and above). The programmable software is based on the LabVIEW platform with a fill-in menu-style operation interface, offering a simple, flexible test interface and user-friendly human-machine interaction. Paired with a Kelvin integrated test socket, it can perform static parameter tests on most electronic components by simply changing the test socket according to the device, along with adaptive system test settings. The system automatically compensates for interference caused by circuitry, contact issues, and EMC to ensure test accuracy. It accurately tests high-precision static parameters such as conduction, shutdown, breakdown, leakage, and gain for Si/SiC/GaN material-based devices like IPM/IGBT/MOS/DIODE/BJT/SCR.

Product Electrical Parameters:

Product Information

Product Model: BW-4022A

Product Name: Semiconductor DC Parameter Tester

Physical Specifications

Main Unit Dimensions: Depth 660*Width 430*Height 210 (mm)

Main Unit Weight: <28kg

Electrical Environment

Power Consumption: <300W

Altitude: Not exceeding 4000m

Environmental Requirements: -20℃ ~ 60℃ (storage), 5℃ ~ 50℃ (operation)

Relative Humidity: 20%RH～75%RH (no condensation, wet-bulb temperature below 45℃)

Atmospheric Pressure: 86Kpa ～106Kpa

Protection Conditions: No significant dust, corrosive or explosive gases, conductive dust, etc.

Grid Requirements: AC220V, ±10%, 50Hz±1Hz

Operating Time: Continuous

Service Areas:

Product Features:

♦♦ Client PC or industrial computer can program and control the tester for testing

♦♦ Menu-driven test programs with editable software, easy operation, and user-friendly interface

♦♦ High-precision static parameter testing for Si/SiC/GaN material-based devices like IPM/IGBT/MOS/DIODE/BJT/SCR

♦♦ System developed based on LabVIEW platform

♦♦ Automatic identification of device polarity, NPN/PNP

♦♦ 16-bit ADC, 1M/S sampling rate

♦♦ High-voltage source 2500V: optional 1.4KV–2KV

♦♦ High-current source 500A: optional 40A, 100A, 200A, 300A, and above

♦♦ Drive voltage 10mV~40V

♦♦ Control current 10uA~100mA

♦♦ Four-wire Kelvin connection ensures connection reliability

♦♦ RS232 serial communication

♦♦ Optional Prober interface and Handler interface (16Bin)

♦♦ Provides a wide range of test adapters

♦♦ Switching board uses high-speed mercury relays, greatly improving test efficiency and reliability

♦♦ Can be connected for testing with sorters, probe stations, tape-and-reel machines, etc.